Surface roughness tester easyRoughness

• Highly accurate roughness meter for workshop and laboratory use
• Compatible with skids and free probes
• Wide range of special measuring probes
• Measuring probes can be extended up to 500 mm
• Automatic calibration
• Measurement lengths configurable from 0.5 to 15 mm
• Configurable measuring speeds
• Calibration of up to 8 measuring probes
• Storage of measurement conditions with images
• Configurable languages: German, English, French, Italian, Spanish, Polish, Chinese
• Technical data
  Measured values:
  DIN/ISO: Ra, Rz (DIN), Rmax, R3z, Rt, Rq (RMS), Rk, Rq, Rv, Rpk, Rvk, MR1, MR2, Rpc, C1, C2, contact ratio Rmr, C0, Cz, V0 Rdg, RL0
  JIS: Ra (Jis), Rz (JIS)
  ISO 12085: R, AR, Rx
  Measurement ranges: Ra, Rq 0 - 20.00 µm Rest 0 - 350 µm
  Measurement range in Z: approx. 450 µm
  Contact point: Diamond tip 5 µm 90° (standard) or 2 µm 60° (optional)
  Measuring force diamond: <, 0.5 mN
  Probe system: analogue hall effect technology with high-linear output
• Supplied with standard probe SKT/5, standard roughness 3.0 µm, boxed

Measuring stand

• Column height 500 mm

Surface roughness tester easyRoughness

• Highly accurate roughness meter for workshop and laboratory use
• Compatible with skids and free probes
• Wide range of special measuring probes
• Measuring probes can be extended up to 500 mm
• Automatic calibration
• Measurement lengths configurable from 0.5 to 15 mm
• Configurable measuring speeds
• Calibration of up to 8 measuring probes
• Storage of measurement conditions with images
• Configurable languages: German, English, French, Italian, Spanish, Polish, Chinese
• Technical data
  Measured values:
  DIN/ISO: Ra, Rz (DIN), Rmax, R3z, Rt, Rq (RMS), Rk, Rq, Rv, Rpk, Rvk, MR1, MR2, Rpc, C1, C2, contact ratio Rmr, C0, Cz, V0 Rdg, RL0
  JIS: Ra (Jis), Rz (JIS)
  ISO 12085: R, AR, Rx
  Measurement ranges: Ra, Rq 0 - 20.00 µm Rest 0 - 350 µm
  Measurement range in Z: approx. 450 µm
  Contact point: Diamond tip 5 µm 90° (standard) or 2 µm 60° (optional)
  Measuring force diamond: <, 0.5 mN
  Probe system: analogue hall effect technology with high-linear output
• Supplied with standard probe SKT/5, standard roughness 3.0 µm, boxed

Measuring stand

• Column height 500 mm