TC layer thickness measuring instrument

• For quick and non-destructive layer thickness measurement of coatings on ferro-magnetic base materials and non-ferrous metals
• With external (TE) probe
• Small, handy device
• Easily readable LCD display
• RS 232 C interface
• Measurement principle
  Model TE-F for measuring non-magnetic layers on a ferro-magnetic base material (steel/iron)
  Model TE-N for measuring non-conductive layers (anodic oxide layer, painted surface protection etc.) on non-ferrous metals
  Model TE-FN combination of both aforementioned measurement principles
• Measurement range 0 to 1250 µm
  Resolution < 100 µm = 0.1 µm / > 100 µm = 1 µm
  Minimum strength of base material 0.3 mm
  Smallest measuring area Ø 6 mm
  Smallest curve radius: F = 1.5 mm convex, F = 25 mm concave, N = 3 mm convex, N = 50 mm concave
  Accuracy ± 4 % of measured value (standard)
  ± 1 % of measured value (two-point calibr.)
  Power supply 4 x LR3 Micro, AAA
  Weight 81 g
  Dimensions L x W x H, 131 x 65 x 28 mm
• Supplied in transport box with zero point plate, spacer foils, 4 batteries LR3 No. 5480794003 and operating manual

Accessories